| Atmel AT89C系列單片機電路板設(shè)計指南 | |
| 所屬分類：參考設(shè)計 | |
| 上傳者：serena | |
| 標簽： Atmel AT89C 單片機 | |
| 所需積分：1分積分不夠怎么辦？ | |
| 文檔介紹： Designing Boards with Atmel AT89C51,AT89C52, AT89C1051, and AT89C2051 for Writing Flash at In-Circuit Test. Recent improvements in chips and testers have made it possible for the tester to begin taking over the role tradi-tionally assigned to the PROM program-mer. Instead of having a PROM pro- grammer write nonvolatile memories before assembling the board, the in-cir- cuit tester writes them during in-circuit testing operations. Many Teradyne Z18- series testers are now in use loading code into nonvolatile memories, micro- controllers and in-circuit programmable logic devices. The purpose of this note is to explain how the Z18 approaches the writing task for Atmel AT89C series IC’s, so that designers of boards using these chips can get the best results. | |
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