中圖分類號： TN402
文獻標識碼： A
DOI：10.16157/j.issn.0258-7998.200290
中文引用格式： 錢宏文，王毅，劉會. 一種基于FPGA的多路HD-SDI測試系統[J].電子技術應用，2020，46(8)：121-125.
英文引用格式： Qian Hongwen，Wang Yi，Liu Hui. Multi-channel HD-SDI test system based on FPGA[J]. Application of Electronic Technique，2020，46(8)：121-125.

Multi-channel HD-SDI test system based on FPGA

Abstract： Aiming at the problems in the present industrial field HD-SDI test such as the test environment building complex, high cost, SDI transmission characteristics measurement is difficult, this paper designs and develops a multi-channel HD-SDI test system based on FPGA.Firstly, the image data stored in SD card is read through FPGA, and then the data is cached in DDR3.Finally, it is sent to external SDI serializer and SDI cable driver after FPGA analysis and processing, so as to achieve the output of multi-channel HD-SDI standard image. The experimental results show that the test system meets the standard and requirements of HD-SDI transmission protocol, and can be used to simulate the test environment and calibration site in different scenarios, and has the advantages of simple operation and wide practicality.

Key words : HD-SDI；DDR3；serializer；cable driver